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Bruker Dimension Icon AFM


General information

The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements. Liquid samples are not allowed on the Icon. For general topographical measurement, please use the Multimode AFM.

To become a user of the Icon, you are required submit a short proposal describing why you need the Dimension Icon and what experiments you will do that can not be done on Multimode AFM. It is helpful to discuss your application with the GLAs first. Proposals should be submitted to the Director of the MMRC, Bruce Brunschwig.

XYZ Scan Range 90 μm x 90 μm x 10 μm typical;
Sample Sizer≤ 210 mm in diameter and ≤ 15 mm thick
Microscope Optics5-Megapixel digital camera; 180–1465 μm viewing area;
The gas kit allows control of ambient atmosphere.


ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM

Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements: Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ): AM-KPFM, FM-KPFM, Peak-force AM-KPFM, Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.

Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software: manipulation of nanomaterials and nanolithography

Other resources:

Contacts GLA