Mighty mouse withMMRC
MMRC Scheduling Research CCI JCAP BILRC BI Caltech Safety

PAGE LINKS: Manuals&Video: Probes: PrTUNA: PFQNM: Kelvin: Modes: Controller: Contacts: Accessories: Specifications

Bruker Dimension Icon AFM

Bryce1

General information

The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements. Liquid samples are not normally allowed on the Icon. For general topographical measurement, please use the Multimode AFM. Dimension Icon Specifications are at the bottom of the page

To become a user of the Icon, you are required to already be a user of the MultiMode AFM and have used it for at least 50 hour and submit a short proposal describing why you need the Dimension Icon and what experiments you will do that can not be done on Multimode AFM. It is helpful to discuss your application with a GLA first. See how to become a user. for more information.

Manuals and Videos:

Probes

Peak Force TUNA Electrical Properties

Peak Force Quantitative Nanomechanical Properties (PFQNM)

Kelvin Probe

Scanning Under Liquids
SPECIAL PERMISSION REQUIRED TO USE LIQUIDS ON DIMENSION ICON

Other Modes

Nanoscope V Controller

Contacts GLA

Bruker

Specifications

XYZ Scan Range 90 μm x 90 μm x 10 μm typical;
Sample Sizer≤ 210 mm in diameter and ≤ 15 mm thick
Microscope Optics5-Megapixel digital camera; 180–1465 μm viewing area;
The gas kit allows control of ambient atmosphere.

Modes

Topography:
ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM

Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements: Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ): AM-KPFM, FM-KPFM, Peak-force AM-KPFM, Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.

Nanomechanics:
Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software: manipulation of nanomaterials and nanolithography