Bruker Dimension Icon AFM
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General information
The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements. Liquid samples are not allowed on the Icon. For general topographical measurement, please use the Multimode AFM.
To become a user of the Icon, you are required submit a short proposal describing why you need the Dimension Icon and what experiments you will do that can not be done on Multimode AFM. It is helpful to discuss your application with the GLAs first. Proposals should be submitted to the Director of the MMRC, Bruce Brunschwig.
| XYZ Scan Range | 90 μm x 90 μm x 10 μm typical; | |
| Sample Sizer | ≤ 210 mm in diameter and ≤ 15 mm thick | |
| Microscope Optics | 5-Megapixel digital camera; 180–1465 μm viewing area; | |
| The gas kit allows control of ambient atmosphere. | ||
Modes
Topography:Contact AFM,
Lateral Force Mode
Tapping Mode AFM
Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements: Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ): AM-KPFM, FM-KPFM, Peak-force AM-KPFM, Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.
Nanomechanics:
Nanomechanical Mapping (Peak-force QNM) Piezoresponse Force Microscopy Force Spectroscopy NanoMan Software: manipulation of nanomaterials and nanolithography
Other resources:
- Icon Manual
- AFM Training Notebook
- Manuals
- NanoScope Analysis Software for PC
- Bruker webinars : Includes: Nanometrology & Quantitative Material Property Mapping, Atomkic Force MIcroscopy, Probe selection, Peakforce Tapping Mode, Nanomechanics, Kelvin Probe,
- ScanAsyst and PeakForce Tapping
- AFM Probe Fundamentals and Selections
- Measuring Absolute Values of Modulus of Elasticity for Soft Materials with AFM
- Peak Force Nano-Mechanical modes, Tutorial
- Peak Force Qant. NanoMechanical Vedio Need to login to Bruker
- High Resolution Quantitative Kelvin Probe Force Microscopy
- Bruker Note On PeakForce Kelvin Probe FM mode
- Advances in Nanomechanics
- The Powerful Diversity of the AFM Probe
- Training Scanning under Liquid
Contacts GLA
- Xinghao Xhou Material Sci (Lewis Group)
- Jingjing Jiang Material Sci (Lewis - Group
- Michael Lichterman JCAP (Lewis Group)