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We have three Atomic Force Microscopes (AFM) and a Scanning Tunneling Microscope (STM). We thank Prof. Nate Lewis, the Beckman Institute, and the Chemistry an Chemical Engineering Division for making them possible.. A Bruker Dimension Icon AFM with Nanoscope V controller: The Dimension Icon AFM is equipped with ScanAsyst® automatic image optimization. The Icon is primarily reserved for advanced AFM-based functions, particularly nanomechanical and nanoelectrical measurements. Click here for details. Scanning modes are described on here A MultiMode-8 AFM with Nanoscope V controller and A, E and J scanners: The MultiMode-8 is an upgrade of our Multimode-3 instrument. The MultiMode-8 is equipped with ScanAsyst® automatic image optimization. It is designed for atomic-scale resolution imaging of surfaces. The newly-upgraded camera system allows easier operation. Click here for more details Other scanning modes are described here. A Digital Instruments STM with Nanoscope V controller: The STM is designed for atomic-scale resolution imaging of surfaces. It can be used in constant current or height mode and as an Electrochemical STM. An Asylum Research-MFP Bio AFM with an inverted microscopy is described here.
Information on how to become a AFM/SPM users are here. Users need to provide their own tips that are appropriate for their application.