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A sample experimental description for the MMRC Kratos Ultra is below. You will need to update it for your conditions since some of the parameters may be different for your samples.

XPS data were collected using a Kratos AXIS Ultra DLD instrument (Kratos Analytical, Manchester, UK) at a background pressure of 1 x 10^-9 Torr. The x-ray source was the monochromatic Al K α line at 1486.6 eV, with 0.2 eV resolution at full width at half maximum. Photoelectrons were collected at 0° from the surface normal and at a retarding pass energy of 80 eV fro survey scans and 20 eV for the high-resolution scans. The XPS data were analyzed using CasaXPS, CASA Software Ltd.