Molecular Materials Research Center

The Beckman Institute of the California Institute of Technology

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The DekTak profilometer is used to measure step heights and roughness of surfaces. A stylus is placed in contact with, and then gently dragged along the surface of the substrate. The vertical deflection measures the change in step height.

Dektak 3030 Manual
Features:

• Step heights from 0.1 to 70 microns.
• Up to 30 mm scan length