General information
The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements.
Liquid samples are not normally allowed on the Icon. We have licenses for:
1) PeakForce quantitative Nanoscale Mechanaical Characterization QNM,
2) Peak froce high resolution current mapping micoscopy PFTUNA,
3) Scanning Capacitve Microscopy SCM,
4) Electrochemical AFM EC-AFM,
5) Dark lift,
6) PeakForce-Sanning Electrochemical microscopy SECM,
7) PeakForce Kelving Probe microscopyPeakForce KPFM. The Icon has been upgraded to be able
to collect electrical and mechanical data at every tapping point, DataCube.
A new NanScope analysis program for PCs on avalable on our website
here.
For general topographical measurement, please use the Multimode AFM. Dimension Icon Specifications are at the bottom of the page
To become a user
of the Icon, you are required to already be a user of the MultiMode AFM and have used it
for at least 50 hour and submit a short proposal
describing why you need the Dimension Icon and what experiments you will do that can not be
done on Multimode AFM. It is helpful to discuss your application with a GLA first.
See how to become a user.
for more information.
Manuals and Videos:
Training
Software
Probes
Peak Force TUNA Electrical Properties
Peak Force Quantitative Nanomechanical Properties (PFQNM)
Kelvin Probe
Scanning Under Liquids SPECIAL PERMISSION REQUIRED TO USE LIQUIDS ON DIMENSION ICON
SECM
Other Modes
Nanoscope V Controller
Contacts GLA
Bruker
Repairs
Specifications
XYZ Scan Range | 90 μm x 90 μm x 10 μm typical; |
Sample Sizer | ≤ 210 mm in diameter and ≤ 15 mm thick |
Microscope Optics | 5-Megapixel digital camera; 180–1465 μm viewing area; |
The gas kit allows control of ambient atmosphere. |
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Modes
Topography:
ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM
Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements:
Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ):
AM-KPFM, FM-KPFM, Peak-force AM-KPFM,
Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.
Nanomechanics:
Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software:
manipulation of nanomaterials and nanolithography
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