The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements. Liquid samples are not normally allowed on the Icon. We have licenses for: 1) PeakForce quantitative Nanoscale Mechanaical Characterization QNM, 2) Peak froce high resolution current mapping micoscopy PFTUNA, 3) Scanning Capacitve Microscopy SCM, 4) Electrochemical AFM EC-AFM, 5) Dark lift, 6) PeakForce-Sanning Electrochemical microscopy SECM, 7) PeakForce Kelving Probe microscopyPeakForce KPFM. The Icon has been upgraded to be able to collect electrical and mechanical data at every tapping point, DataCube. A new NanScope analysis program for PCs on avalable on our website here. For general topographical measurement, please use the Multimode AFM. Dimension Icon Specifications are at the bottom of the page
To become a user of the Icon, you are required to already be a user of the MultiMode AFM and have used it for at least 50 hour and submit a short proposal describing why you need the Dimension Icon and what experiments you will do that can not be done on Multimode AFM. It is helpful to discuss your application with a GLA first. See how to become a user. for more information.
|XYZ Scan Range||90 μm x 90 μm x 10 μm typical;|
|Sample Sizer||≤ 210 mm in diameter and ≤ 15 mm thick|
|Microscope Optics||5-Megapixel digital camera; 180–1465 μm viewing area;|
|The gas kit allows control of ambient atmosphere.|