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Bruker Dimension Icon AFM

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General information

The Dimension Icon AFM is capable of advanced AFM-based techniques including nanomechanical and nanoelectrical measurements. Liquid samples may be utilized with the Dimension Icon after explicit approval from the GLAs and the Manager. Supported modes include:

1) PeakForce Quantitative Nanoscale Mechanical Characterization (QNM)

2) Peak Force high resolution current mapping micoscopy (PFTUNA)

3) Scanning Capacitance Microscopy (SCM)

4) Electrochemical AFM (EC-AFM)

5) Dark lift

6) PeakForce Sanning Electrochemical Microscopy (SECM)

7) PeakForce Kelvin Probe (KPFM)

The Icon has been upgraded to be able to collect electrical and mechanical data at every tapping point using Bruker DataCube. A new NanScope analysis program for PCs on avalable on our website here. Dimension Icon specifications are at the bottom of the page.

Contacts

Manuals and Videos:

Training

Software

Probes

Peak Force TUNA Electrical Properties

Peak Force Quantitative Nanomechanical Properties (PFQNM)

Kelvin Probe

Scanning Under Liquids
(Special Permission Required for Use of Liquids)

SECM

Other Modes

Nanoscope V Controller

Bruker

Repairs

Specifications

XYZ Scan Range 90 μm x 90 μm x 10 μm typical;
Sample Sizer= 210 mm in diameter and = 15 mm thick
Microscope Optics5-Megapixel digital camera; 180–1465 μm viewing area;
The gas kit allows control of ambient atmosphere.

Modes

Topography:
ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM

Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements: Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ): AM-KPFM, FM-KPFM, Peak-force AM-KPFM, Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.

Nanomechanics:
Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software: manipulation of nanomaterials and nanolithography