Bruker Dimension Icon AFM

General information

The Dimension Icon AFM is reserved for advanced AFM-based techniques, particularly for nanomechanical and nanoelectrical measurements. Liquid samples are not normally allowed on the Icon. We have licenses for: 1) PeakForce quantitative Nanoscale Mechanaical Characterization QNM, 2) Peak froce high resolution current mapping micoscopy PFTUNA, 3) Scanning Capacitve Microscopy SCM, 4) Electrochemical AFM EC-AFM, 5) Dark lift, 6) PeakForce-Sanning Electrochemical microscopy SECM, 7) PeakForce Kelving Probe microscopyPeakForce KPFM. The Icon has been upgraded to be able to collect electrical and mechanical data at every tapping point, DataCube. A new NanScope analysis program for PCs on avalable on our website here. For general topographical measurement, please use the Multimode AFM. Dimension Icon Specifications are at the bottom of the page

To become a user of the Icon, you are required to already be a user of the MultiMode AFM and have used it for at least 50 hour and submit a short proposal describing why you need the Dimension Icon and what experiments you will do that can not be done on Multimode AFM. It is helpful to discuss your application with a GLA first. See how to become a user. for more information.

Manuals and Videos:

• How to become a user of the Dimension Icon AFM
• Quick Icon User Guide
• Bruker DIcon Manual
• Bruker Experimental Manual
• Bruker DIcon Training Guide
• Bruker Nanoscope Software Manual
• Laser Alignment Video
• Scan Assist Mode Video
• Bruker Training Manuals and Videos


• U of Col AFM Training Manual
• SPM Training Notebook
• Bruker webinars :
• Bruker Service Need to login
• Repairs, Trouble Shooting, and Calibration of Icon

Training

• Using the Dim. Icon Introduction
• Nanoscope Software Training I
• Nanoscope Software Training II
• Nanoscope Software training III
• Conductivity
• Bruker Advanced Functions of Nanoscope Software
• Training videos from CMM University of Queensland Australia

Software

• NanoScope Analysis Software for Win 10 installation program
• NanoScope Analysis Software for Win7 64 bit
• NanoScope Analysis Software for PC 32 bit
• 3rd Party Software for Images (PC & Mac)

Probes

• AFM Probe Fundamentals and Selections
• The Powerful Diversity of the AFM Probe
• K-Tek AFM Probes and Supplies
• NaugaNeedles AFM Probes
• AppNano AFM Probes

Peak Force TUNA Electrical Properties

• Peak Force TUNA Video
• Scan Asyst Peak Force Tuna Video
• Testing PFT
• Resistance and Conductivity

Peak Force Quantitative Nanomechanical Properties (PFQNM)

• PF QNM Users Guide
• PF QNM Video
• QNM Adv Training Includes PF TUNA and QNM
• Measuring Absolute Values of Modulus of Elasticity for Soft Materials with AFM
• Advances in Nanomechanics

Kelvin Probe

• High Resolution Quantitative Kelvin Probe Force Microscopy
• Bruker Note On PeakForce Kelvin Probe FM mode

Scanning Under Liquids
SPECIAL PERMISSION REQUIRED TO USE LIQUIDS ON DIMENSION ICON

• Scanning under Liquid Video
• Training Scanning under Liquid
• Liquid Samples User Guide

SECM

• Using the Bio-Logic Bipotentiostat to do SECM

Other Modes

• Surface Potential Interleave and lift modes
• Scanning Probe Modes
• High Speed Digital Capture
• Test of System Noise
• Adj Laser Focus
• Piezo Force Microscopy
• Scanning Capacitance Microscopy

Nanoscope V Controller

• NanoScope Command Reference
• Nanoscope V Operation
• Nanoscope V Software
• Computer Connection to AFM
• WinXP License Tag
• Calibration data 062015

Contacts GLA

• Sean Byrne CCE Lewis Group
• Alex Ye CCE Lewis Group

Bruker

• Bruker AFM

Repairs

• Replace Door Gas Springs
• Alignment Station Calibration

Specifications

XYZ Scan Range	90 μm x 90 μm x 10 μm typical;
Sample Sizer	≤ 210 mm in diameter and ≤ 15 mm thick
Microscope Optics	5-Megapixel digital camera; 180–1465 μm viewing area;
The gas kit allows control of ambient atmosphere.

Modes

Topography:
ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM

Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements: Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ): AM-KPFM, FM-KPFM, Peak-force AM-KPFM, Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.

Nanomechanics:
Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software: manipulation of nanomaterials and nanolithography