| PAGE LINKS: | Procedures | Tutorials | Contacts | Accessories | Other Info | Other Instruments |
 |
 |
 |
The Dimension Icon AFM is capable of advanced AFM-based techniques including nanomechanical and nanoelectrical measurements. Liquid samples may be utilized with the Dimension Icon after explicit approval from the GLAs and the Manager. Supported modes include:
1) PeakForce Quantitative Nanoscale Mechanical Characterization (QNM)
2) Peak Force high resolution current mapping micoscopy (PFTUNA)
3) Scanning Capacitance Microscopy (SCM)
4) Electrochemical AFM (EC-AFM)
5) Dark lift
6) PeakForce Sanning Electrochemical Microscopy (SECM)
7) PeakForce Kelvin Probe (KPFM)
The Icon has been upgraded to be able to collect electrical and mechanical data at every tapping point using Bruker DataCube. A new NanScope analysis program for PCs on avalable on our website here. Dimension Icon specifications are at the bottom of the page.
| XYZ Scan Range | 90 μm x 90 μm x 10 μm typical; | |
| Sample Sizer | = 210 mm in diameter and = 15 mm thick | |
| Microscope Optics | 5-Megapixel digital camera; 180–1465 μm viewing area; | |
| The gas kit allows control of ambient atmosphere. | ||
