General information
The Dimension Icon AFM is capable of advanced AFM-based techniques including nanomechanical and nanoelectrical measurements.
Liquid samples may be utilized with the Dimension Icon after explicit approval from the GLAs and the Manager. We have licenses for:
1) PeakForce quantitative Nanoscale Mechanaical Characterization QNM,
2) Peak froce high resolution current mapping micoscopy PFTUNA,
3) Scanning Capacitve Microscopy SCM,
4) Electrochemical AFM EC-AFM,
5) Dark lift,
6) PeakForce-Sanning Electrochemical microscopy SECM,
7) PeakForce Kelving Probe microscopyPeakForce KPFM. The Icon has been upgraded to be able to collect electrical and mechanical data at every tapping point using Bruker DataCube.
A new NanScope analysis program for PCs on avalable on our website
here.
For general topographical measurement, please use the Multimode AFM. Dimension Icon Specifications are at the bottom of the page
To become a user of the Icon, you must submit a proposal to the GLAs via e-mail (cc the Manager) that describes the experimental work to be carried out and any literature president. It may be helpful to disucss the proposal with a GLA first.
See how to become a user
for more information.
Contacts
Manuals and Videos:
Training
Software
Probes
Peak Force TUNA Electrical Properties
Peak Force Quantitative Nanomechanical Properties (PFQNM)
Kelvin Probe
Scanning Under Liquids SPECIAL PERMISSION REQUIRED TO USE LIQUIDS ON DIMENSION ICON
SECM
Other Modes
Nanoscope V Controller
Bruker
Repairs
Specifications
| XYZ Scan Range | 90 μm x 90 μm x 10 μm typical; |
| Sample Sizer | = 210 mm in diameter and = 15 mm thick |
| Microscope Optics | 5-Megapixel digital camera; 180–1465 μm viewing area; |
| The gas kit allows control of ambient atmosphere. |
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Modes
Topography:
ScanAsyst, self-optimizing scan mode
Contact AFM,
Lateral Force Mode
Tapping Mode AFM
Nanoelectricity:
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM
Current/resistivity measurements:
Peak-Force TUNA, TUNA, SSRM, C-AFM
Surface potential detection (Kelvin-Probe ):
AM-KPFM, FM-KPFM, Peak-force AM-KPFM,
Peak-force FM-KPFM, HV-KPFM
Scanning capacitance measurements.
Nanomechanics:
Nanomechanical Mapping (Peak-force QNM)
Piezoresponse Force Microscopy
Force Spectroscopy
NanoMan Software:
manipulation of nanomaterials and nanolithography
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