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Two Digital Instruments Nano Scope III with both EC-STM and Multimode AFM Heads

We have a Digital Instruments Multi-Mode AFM-2 with a Nanoscope IIIa controller and type A, E, and J scanners. This instrument is capable of operating in the following modes: contact mode; tapping mode; contact or tapping mode in fluids using the liquid cell accessory; STM; lateral force mode (i.e. friction); force imaging (e.g. sample-tip attraction and elasticity); magnetic force mode; and electric force imaging (electric field and surface potential. Users need to provide the tips that are appropriate for their application.

We also have a Digital Instruments model ECSTM with a Nanoscope III controller and type AI and D scanners. This instrument can be used for STM and electrochemical STM applications.

We have Nanoscope v5.12r5 software for the MMAFM and ECSTM.

Tutorials:
Local Quick Reference Users Manual for AFM Exploring the Nanoworld with LEGO's, U. of Wis
Tutorial, Pacific Nanotech Scanning Probe Microscope
Nanoscience: Underlying Concepts and Phenomena, PNAS An Overview to Scanning Probe Microscopy, James R. Smith
AFM an overview Scanning Probe Microscopy by John Cross

Nanoscience another STM-AFM manufacturer
How to restore the AFM STM computer after a disk crash: restore

Contacts
Edgardo Garcia Scanning Tunnelling Microscopy/Atomic Force Microscopy
David Knapp Scanning Tunnelling Microscopy/Atomic Force Microscopy
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