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MultiQuant XPS Analysis of Overlayers

MultiQuant, Surface Analysis for X-ray Photoelectron Spectroscopy, MultiQuant is a quantitative evaluation program for X-ray Photoelectron Spectroscopy, serving as a practical and universal tool for the surface analyst. It applies the "classic" methods of the quantitative calculations using the integrated intensity of the measured XPS lines. Numerous quantification overlayer models (Homogeneous, Oxide-Layer, Layers-on-Plane, Layers-on-Sphere, Layers-on-Cylinder, Layers-on-Nanotube, Islands-on-Plane, Islands-on-Sphere, Islands-on-Cylinder, Layers-on-Polyhedron, Islands-on-Polyhedron) are part of the software. Calculation of layer thickness on curved surfaces and nanotubes and calculation of layer thickness for angle dependent experiment sets are included.

MultiQuant is freeware for non-commercial use. Look at the examples and download the program if you consider it useful. A copy of MultiQuant can be found on the MMRC website and on the Institute of Materials and Environmental Chemistry, Chemical Research Center of the Hungarina Academy of Sciences. A good place is .