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We have three Atomic Force Microscopes (AFM) and a Scanning Tunneling Microscope (STM). We thank
Prof. Nate Lewis, the Beckman Institute, and the Chemistry an Chemical Engineering Division for making them possible..
A Bruker Diminsion Icon AFM with Nanoscope V controller:
The Dimension Icon AFM is equipped with ScanAsyst® automatic image optimization.
The Icon is primarily reserved for advanced AFM-based functions,
particularly nanomechanical and nanoelectrical measurements. Click here for details.
Scanning modes are described on here
A MultiMode-8 AFM with Nanoscope V controller and A, E and J scanners:
The MultiMode-8 is an upgrade of our Multimode-3 instrument.
The MultiMode-8 is equipped with ScanAsyst® automatic image optimization.
It is designed for atomic-scale resolution imaging of surfaces.
The newly-upgraded camera system allows easier operation. Click here for more details
Other scanning modes are described
here.
A Digital Instruments STM with Nanoscope V controller:
The STM is designed for atomic-scale resolution imaging of surfaces. It can be
used in constant current or height mode and as an Electrochemical STM.
An Asylum Research-MFP Bio AFM with an inverted microscopy is described here.
Information on how to become a SPM users are here.
Users need to provide their own tips that are appropriate for their application.